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- Published by
- Christopher Walker
- Organisation / Company
- University of York
- Address 1
- Department of Electronics
- Address 2
- Heslington
- Postcode
- YO10 5DD
- City
- York
- Country
- United Kingdom
- Telephone (Office)
- +441904432406
- Fax (Office)
- +441904432335
- E-Mail (Office)
- Website
- http://www.elec.york.ac.uk/
- Votes
- 0
- Visited
- 224
Our expertise involves the use of Schottky field emission tips as electron sources for scanning electron microscopes (SEMs). Existing SEMs with traditional thermionic sources can be adapted for use with the field emission tips to provide a much greater spatial resolution. We also have experience in the growth of carbon nanotubes (CNTs) and the use of CNTs as field emission sources.
A technique that we have experience in (unique in the UK) is Scanning Low Energy Electron Microscopy (SLEEM). Using SLEEM, electrons can be slowed to as low as 1eV electron energy. The contrast in the images that SLEEM produces are still not fully understood.
The group is also developing techniques to acquire Auger electron spectra at high speed using the hyperbolic field analyser and derivatives. This technology could be inserted into standard SEMs to provide elemental analysis of surfaces in standard (non Ultra High Vacuum) SEMs. Surfaces can be cleaned using an Ar ion gun and analysed a few seconds after cleaning.
We can simulate many of the electron processes in our experiments using our own Monte Carlo simulation program. This program has been developed to work with three dimensional shapes and has a number of unique features.
Equipment:
(a) Class 10,000 clean room and associated facilities (see http://www.elec.york.ac.uk/facilities/cleanRoom.html)
(b) Phi Scanning Auger Microprobe
(c) Scanning Low Energy Electron Microscope
(d) JEOL Scanning electron microscope with fitted electron energy analyser and Ar gun
(e) Field emission chambers.